Non Destructive Testing by Ultrasonics : Instrumentation

   Standards Tanks

   PC Boards

   UTWIN Software
   ü Hardware setting
   ü Test parameter setup
   ü Real Time Acquisition
   ü Post-Analysis
   ü C-SCAN Annotations
             and report
   ü Data storage
   ü Other Options
   ü Applications

   Accessories

   Industrial & Specific
      Systems

   Pocket UT

   Immersion Systems
      Updating

Adapted Software

UTWIN
      Software for Ultrasonic acquisition and analysis

UTWIN is a complete software designed for ULTRASONIC acquisition. It is easy to use and has a friendly interface and analysis tools, working in real time to display A-SCAN, B-SCAN and C-SCAN. UTWIN can work under WINDOWS 98, 2000, XP pro, Vista.

Hardware Setting

    Select PULSER/ RECEIVER/ DIGITIZER UT and axis control boards.
Setup parameters for up to 8 axis mechanics : Motors, belts, gear
      ratio….
    Easy adaptation to all kind of mechanic working with stepper motors
     and/or encoders, like immersion tank, gantry, robots...



Test parameter setup

   Pulser & receiver setup with DAC, AGC
   Echo mode or True Transmission
   Time average, high end filtering, offset,
   Acquisition range,
   Digitization parameters.

   4 independent gates with detection strategy and feature extraction:
     Amplitude, Time of flight, Energy, Thickness, Rise time, correlation,
     velocity...

   Scan area C-SCAN & B-SCAN,
   Manual jog for all axis,
   Store select, display parameters



Real Time Acquisition

    A-SCAN with cursors and values displayed from the 4 available gates,
       thickness measurements between gates, FFT, phases.
B-SCAN, B’SCAN view in depth (with RF option).

   b-SCAN, b'SCAN Amplitude or Time of Flight curves.

   CSCAN with AMPLITUDE, TIME of FLIGHT, VELOCITY… features.

   Synchronisation on back wall echo

   Motion back on defect

   Multiple windows display, multi channel.

   RF Signal (in option) allows modifying gate parameters after acquisition

                                                                                                        A-SCAN, CS-CAN, BS-CAN, FFT, STATISTICS

Typical Screen


            TOFD option & WELFD analysis                                           File replay from previous acquisition
                                                                                                using the previous software ULTRAWIN


     CSCAN 3D graph, display C-SCAN tables, display                             ASCAN, CSCAN et BSCAN RF analysis
   maximum, Minimum, values…



Post-Anlalysis

     Replay ASCAN, BSCAN, CSCAN using data within all gates and
       features, FFT in gates.
     Simple or double cursors.

     Back on defect in replay mode

     Zoom

     Image filter,

     Color palette,

     STATISTIC analysis (option) in all image or selected area
     CLUSTER analysis (option): draw bounds according to
        selected threshold, display surfaces and location.
     SURFACE analysis, maximum detection, signal to noise ratio..



C-SCAN Annotations


               Report with Word, Excel, ...






Data Storage
     Test Setup (Projects, desktop)
     Data C-SCAN, B-SCAN binary or ASCII
     Auto store A-SCAN binary or ASCII
     Multiple graphical formats JPG TIFF CSV…
     Hardcopy printing graphs, windows or page



Other Options


     Multiple chained acquisition                        CHAIN
     Complex contour following                         CONTOUR
     Area analysis                                            CLUSTERS
     RF waveform storage                               RF
     Weld analysis                                           WELD
     Time of Flight diffraction                            TOFD
     Transducer characterisation in immersion TCP



APPLICATIONS

Some typical applications :

BOND analysis, automatically display the percentage of bonded area:

           B-SCAN RF

                                                                                                                                                                     C-SCAN on thick composite






                                     Material characterisation


                        Defect detection